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Module – I 08 Hours Introduction: Historical Perspective, VLSI Design Methodologies, VLSI Design Flow, Design Hierarchy, Concept of Regularity, Modularity and Locality, VLSI Design Styles, Computer-Aided Design Technology.
Fabrication of MOSFETs: Introduction, Fabrication Processes Flow – Basic Concepts, The CMOS n-Well Process, Layout Design Rules, Stick Diagrams, Full-Customs Mask Layout Design.
MOS Transistor: The Metal Oxide Semiconductor (MOS) Structure, The MOS System under External Bias, Structure and Operation of MOS Transistor (MOSFET), MOSFET Current-Voltage Characteristics, MOSFET Scaling and Small-Geometry Effects, MOSFET Capacitance.
(Chapter 1 to 3 of Text Book 1 and for Stick Diagram Text Book 2)
Module – II 14 Hours MOS Inverters – Static Characteristics: Introduction, Resistive-Load Inverters, Inverters with n-Type MOSFET Load, CMOS Inverter.
MOS Inverters – Switching Characteristics and Interconnect Effects: Introduction, Delay-Time Definitions, Calculation of Delay-Times, Inverter Design with Delay Constraints, Estimation of Interconnect Parasitics, Calculation of Interconnect Delay, Switching Power Dissipation of CMOS Inverters.
Combinational MOS Logic Circuits: Introduction, MOS Logic Circuits with Depletion nMOS Loads, CMOS Logic Circuits, Complex Logic Circuits, CMOS Transmission Gates (Pass Gates).
(Chapter 5 to 7 of Text Book 1)
Module – III 18 Hours Sequential MOS Logic Circuits: Introduction, Behaviour of Bistable Elements, SR Latch Circuits, Clocked Latch and Flip-Flop Circuits, CMOS D-Latch and Edge-Triggered Flip- Flop.
Dynamic Logic Circuits: Introduction, Basic Principles of Pass Transistor Circuits, Voltage Bootstrapping, Synchronous Dynamic Circuit Techniques, Dynamic CMOS Circuit Techniques, High Performance Dynamic CMOS Circuits.
Semiconductor Memories: Introduction, Dynamic Random Access Memory (DRAM), Static Random Access Memory (SRAM), Non-volatile Memory, Flash Memory.
Design for Testability: Introduction, Fault Types and Models, Ad Hoc Testable Design Techniques, Scan-Based Techniques, Built-In Self-Test (BIST) Techniques, Current Monitoring IDDQ Test.
1. Sung-Mo Kang and Yusuf Leblebici, CMOS Digital Integrated Circuits: Analysis and
Design, 3rd Edn., Tata McGraw-Hill Publishing Company Limited, 2003.
2. K. Eshraghian and N.H.E. Weste, Principles of CMOS VLSI Design – a Systems
Perspective, 2nd Edn., Addison Wesley, 1993.